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C3M0065090D
Silicon Carbide Power MOSFET TM
C3M MOSFET Technology
N-Channel Enhancement Mode Features • C3M SiC MOSFET technology • High blocking voltage with low On-resistance • High speed switching with low capacitances • Fast intrinsic diode with low reverse recovery (Qrr) • Halogen free, RoHS compliant
Benefits • Higher system efficiency • Reduced cooling requirements • Increased power density • Increased system switching frequency
Applications • Renewable energy • EV battery chargers • High voltage DC/DC converters • Switch Mode Power Supplies
Package
VDS ID @ 25˚C RDS(on)
900 V 36 A 65 mΩ
Part Number C3M0065090D
Package TO-247-3
Marking C3M0065090
Maximum Ratings (TC = 25 ˚C unless otherwise specified)
Symbol
Parameter
Value
VDSmax VGSmax VGSop
Drain - Source Voltage Gate - Source Voltage (dynamic) Gate - Source Voltage (static)
ID
Continuous Drain Current
900 -8/+19 -4/+15
36 23
ID(pulse) Pulsed Drain Current
90
EAS
Avalanche energy, Single pulse
PD
Power Dissipation
TJ , Tstg Operating Junction and Storage Temperature
TL
Solder Temperature
Md
Mounting Torque
Note (1): When using MOSFET Body Diode VGSmax = -4V/+19V Note (2): MOSFET can also safely operate at 0/+15 V
110
125
-55 to +150 260
1 8.8
Unit
Test Conditions
V VGS = 0 V, ID = 100 μA V AC (f >1 Hz) V Static
VGS = 15 V, TC = 25˚C A
VGS = 15 V, TC = 100˚C
A Pulse width tP limited by Tjmax
mJ ID = 22A, VDD = 50V W TC=25˚C, TJ = 150 ˚C
˚C
˚C 1.6mm (0.063”) from case for 10s
Nm lbf-in
M3 or 6-32 screw
Note
Note: 1 Note: 2 Fig. 19
Fig. 22
Fig. 20
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C3M0065090D Rev. D, 06-2019
Electrical Characteristics (TC = 25˚C unless otherwise specified)
Symbol
Parameter
V(BR)DSS Drain-Source Breakdown Voltage
VGS(th)
Gate Threshold Voltage
IDSS
Zero Gate Voltage Drain Current
IGSS
Gate-Source Leakage Current
RDS(on) Drain-Source On-State Resistance
gfs
Transconductance
Min. 900 1.8
Typ.
2.1 1.6 1 10 65 90 16 13
Ciss
Input Capacitance
760
Coss
Output Capacitance
66
Crss
Reverse Transfer Capacitance
5.0
Eoss
Coss Stored Energy
16
EON
Turn-On Switching Energy (Body Diode FWD)
343
EOFF
Turn Off Switching Energy (Body Diode FWD)
46
td(on)
Turn-On Delay Time
45
tr
Rise Time
13
td(off)
Turn-Off Delay Time
20
tf
Fall Time
8
RG(int)
Internal Gate Resistance
3.5
Qgs
Gate to Source Charge
9
Qgd
Gate to Drain Charge
13
Qg
Total Gate Charge
35
Max.
3.5
100 250 78
Unit V V V μA nA
mΩ
S
Test Conditions VGS = 0 V, ID = 100 μA VDS = VGS, ID = 5 mA VDS = VGS, ID = 5 mA, TJ = 150ºC VDS = 900 V, VGS = 0 V VGS = 15 V, VDS = 0 V VGS = 15 V, ID = 20 A VGS = 15 V, ID = 20A, TJ = 150ºC VDS= 20 V, IDS= 20 A VDS= 20 V, IDS= 20 A, TJ = 150ºC
pF VGS = 0 V, VDS = 600 V f = 1 MHz VAC = 25 mV
μJ
μJ VDS = 400 V, VGS = -4 V/15 V, ID = 20 A, RG(ext) = 2.5 Ω, L= 65.7 μH, TJ = 150ºC
VDD = 400 V, VGS = -4 V/15 V
ns
ID = 20 A, RG(ext) = 2.5 Ω,
Timing relative to VDS
Inductive load
Ω f = 1 MHz, VAC = 25 mV
VDS = 400 V, VGS = -4 V/15 V nC ID = 20 A
Per IEC60747-8-4 pg 21
Reverse Diode Characteristics (TC = 25˚C unless otherwise specified)
Symbol Parameter
VSD
Diode Forward Voltage
IS IS, pulse
trr Qrr Irrm
Continuous Diode Forward Current Diode pulse Current Reverse Recovery time Reverse Recovery Charge Peak Reverse Recovery Current
Typ. 4.4 4.0
26 145
8
Max.
23.5 90
Unit V V A A ns nC A
Test Conditions VGS = -4 V, ISD = 10 A VGS = -4 V, ISD = 10 A, TJ = 150 °C VGS = -4 V VGS = -4 V, pulse width tP limited by Tjmax
VGS = -4 V, ISD = 20 A, VR = 400 V dif/dt = 900 A/µs, TJ = 150 °C
Note Fig. 11
Fig. 4, 5, 6 Fig. 7 Fig. 17, 18 Fig. 16 Fig. 26, Note 3
Fig. 27
Fig. 12
Note Fig. 8, 9, 10 Note 1 Note 1
Note 1
Thermal Characteristics
Symbol Parameter
Max.
Unit
Test Conditions
RθJC
Thermal Resistance from Junction to Case
RθJA
Thermal Resistance From Junction to Ambient
1.0 °C/W
40
Note (3): Turn-off and Turn-on switching energy and timing values measured using SiC MOSFET Body Diode
Note Fig. 21
2
C3M0065090D Rev. D, 06-2019
Typical Performance
Drain-Source Current, IDS (A)
Drain-Source Current, IDS (A)
80
Conditions:
70
TJ = -55 °C tp = < 200 µs
60
50
40
30
20
10
0
0.0
2.0
VGS = 15V VGS = 13V
4.0
6.0
8.0
Drain-Source Voltage, VDS (V)
VGS = 11V
VGS = 9V
VGS = 7V
10.0
12.0
Figure 1. Output Characteristics TJ = -55 ºC
80 Conditions:
70 TJ = 150 °C tp = < 200 µs
60
50
VGS = 11V
VGS = 13V
VGS = 15V
VGS = 9V
40
30
VGS = 7V
20
10
0
0.0
2.0
4.0
6.0
8.0
10.0
12.0
Drain-Source Voltage, VDS (V)
Figure 3. Output Characteristics TJ = 150 ºC
120 Conditions: VGS = 15 V
100 tp < 200 µs
80
60
TJ = 150 °C
TJ = -55 °C TJ = 25 °C
40
20
0
0
10
20
30
40
50
60
Drain-Source Current, IDS (A)
Figure 5. On-Resistance vs. Drain Current For Various Temperatures
On Resistance, RDS On (mOhms)
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C3M0065090D Rev. D, 06-2019
On Resistance, RDS On (mOhms)
On Resistance, RDS On (P.U.)
Drain-Source Current, IDS (A)
80
Conditions:
70
TJ = 25 °C tp = < 200 µs
60
50
40
30
20
10
0
0.0
2.0
VGS = 15V
VGS = 13V
VGS = 11V
VGS = 9V
VGS = 7V
4.0
6.0
8.0
Drain-Source Voltage, VDS (V)
10.0
12.0
Figure 2. Output Characteristics TJ = 25 ºC
2.0 Conditions:
1.8 IDS = 20 A VGS = 15 V
1.6 tp < 200 µs
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
-50
-25
0
25
50
75
100
125
150
Junction Temperature, TJ (°C)
Figure 4. Normalized On-Resistance vs. Temperature
140
Conditions:
IDS = 20 A
120
tp < 200 µs
100
VGS = 11 V
80
VGS = 13 V
60
VGS = 15 V
40
20
0
-50
-25
0
25
50
75
100
125
150
Junction Temperature, TJ (°C)
Figure 6. On-Resistance vs. Temperature For Various Gate Voltage
Drain-Source Current, IDS (A)
Typical Performance
50 Conditions: VDS = 20 V tp < 200 µs
40
30
20
TJ = 150 °C TJ = 25 °C
TJ = -55 °C
10
Drain-Source Current, IDS (A)
0 0
-9
-8
2
4
6
8
Gate-Source Voltage, VGS (V)
Figure 7. Transfer Characteristic for Various Junction Temperatures
-7
-6
-5
-4
-3
-2
-1
VGS = -4 V
VGS = 0 V
10
0 0 -10 -20
VGS = -2 V
-30
-40
-50
Drain-Source Voltage VDS (V)
-60
Conditions:
-70
TJ = 25°C
tp < 200 µs
-80
Figure 9. Body Diode Characteristic at 25 ºC
3.0
Conditons
VGS = VDS
2.5
IDS = 5 mA
2.0
1.5
1.0
0.5
0.0
-50
-25
0
25
50
75
100
125
150
Junction Temperature TJ (°C)
Figure 11. Threshold Voltage vs. Temperature
Threshold Voltage, Vth (V)
Gate-Source Voltage, VGS (V)
Drain-Source Current, IDS (A)
Drain-Source Current, IDS (A)
-9
-8
-7
-6
-5
-4
-3
-2
-1
0
0
-10
VGS = -4 V
VGS = 0 V
-20
-30 VGS = -2 V
-40
-50
Drain-Source Voltage VDS (V)
-60
Conditions: TJ = -55°C
-70
tp < 200 µs
-80
Figure 8. Body Diode Characteristic at -55 ºC
-10 -9
-8
-7
-6
-5
-4
-3
-2
-1
0
0
-10
VGS = -4 V
VGS = 0 V
-20
-30 VGS = -2 V
-40
-50
Drain-Source Voltage VDS (V)
-60
Conditions:
-70
TJ = 150°C
tp < 200 µs
-80
Figure 10. Body Diode Characteristic at 150 ºC
16 Conditions: IDS = 20 A IGS = 50 mA
12 VDS = 400 V TJ = 25 °C
8
4
0
-4
0
5
10
15
20
25
30
35
40
Gate Charge, QG (nC)
Figure 12. Gate Charge Characteristics
4
C3M0065090D Rev. D, 06-2019
Typical Performance
-8
-7
-6
-5
-4
-3
-2
VGS = 0 V VGS = 5 V
Drain-Source Current, IDS (A)
Drain-Source Voltage VDS (V)
-1
0
0
-10
-20
-30
VGS = 10 V -40
VGS = 15 V
-50
-60
Conditions: TJ = -55 °C
-70
tp < 200 µs
-80
Figure 13. 3rd Quadrant Characteristic at -55 ºC
Drain-Source Current, IDS (A)
-8
-7
-6
-5
-4
-3
-2
-1
0
0
VGS = 0 V -10
-20 VGS = 5 V
-30 VGS = 10 V
-40 VGS = 15 V
-50
-60
Drain-Source Voltage VDS (V)
Conditions:
-70
TJ = 150 °C
tp < 200 µs
-80
Figure 15. 3rd Quadrant Characteristic at 150 ºC
10000 1000
Conditions: TJ = 25 °C VAC = 25 mV f = 1 MHz
Ciss
Coss 100
Stored Energy, EOSS (µJ)
Drain-Source Current, IDS (A)
-8
-7
-6
-5
-4
-3
-2
-1
0
0
VGS = 0 V VGS = 5 V
-10
-20
-30 VGS = 10 V
-40 VGS = 15 V
-50
Drain-Source Voltage VDS (V)
-60
Conditions: TJ = 25 °C
-70
tp < 200 µs
-80
Figure 14. 3rd Quadrant Characteristic at 25 ºC
35
30
25
20
15
10
5
0 0 100 200 300 400 500 600 700 800 900 1000 Drain to Source Voltage, VDS (V)
Figure 16. Output Capacitor Stored Energy
10000 1000
Conditions: TJ = 25 °C VAC = 25 mV f = 1 MHz
Ciss
100
Coss
Capacitance (pF)
Capacitance (pF)
10
Crss
1
0
50
100
150
200
Drain-Source Voltage, VDS (V)
Figure 17. Capacitances vs. Drain-Source Voltage (0 - 200V)
10 Crss
1 0 100 200 300 400 500 600 700 800 900 Drain-Source Voltage, VDS (V)
Figure 18. Capacitances vs. Drain-Source Voltage (0 - 900V)
5
C3M0065090D Rev. D, 06-2019
Typical Performance
Drain-Source Continous Current, IDS (DC) (A)
40
Conditions:
35
TJ ≤ 150 °C
30
25
20
15
10
5
0
-55
-30
-5
20
45
70
95
Case Temperature, TC (°C)
120 145
Figure 19. Continuous Drain Current Derating vs. Case Temperature
Junction To Case Impedance, ZthJC (oC/W)
1
0.5
0.3
0.1
100E-3
0.05
0.02 0.01
SinglePulse
10E-3
1E-6
10E-6 100E-6 1E-3
10E-3 100E-3
1
10
Time, tp (s)
Figure 21. Transient Thermal Impedance (Junction - Case)
1800 1600 1400 1200 1000
Conditions: TJ = 25 °C VDD = 600 V RG(ext) = 2.5 Ω VGS = -4V/+15V FWD = C3M0065090D L = 65.7 μH
ETotal EOn
800
600
400
EOff
200
0
0
10
20
30
40
50
Drain to Source Current, IDS (A)
Figure 23. Clamped Inductive Switching Energy vs. Drain Current (VDD = 600V)
Switching Loss (µJ)
Switching Loss (µJ)
Drain-Source Current, IDS (A)
Maximum Dissipated Power, Ptot (W)
140 Conditions: TJ ≤ 150 °C
120
100
80
60
40
20
0
-55
-30
-5
20
45
70
95
Case Temperature, TC (°C)
120 145
Figure 20. Maximum Power Dissipation Derating vs. Case Temperature
100.00
10.00
Limited by RDS On
1.00
10 µs 100 µs 1 ms
100 ms
0.10
Conditions: TC = 25 °C D = 0, Parameter: tp 0.01 0.1
1
10
100
Drain-Source Voltage, VDS (V)
1000
Figure 22. Safe Operating Area
1200 1000 800
Conditions: TJ = 25 °C VDD = 400 V RG(ext) = 2.5 Ω VGS = -4V/+15V FWD = C3M0065090D L = 65.7 μH
600
ETotal EOn
400 EOff
200
0
0
5
10
15
20
25
30
35
40
45
Drain to Source Current, IDS (A)
Figure 24. Clamped Inductive Switching Energy vs. Drain Current (VDD = 400V)
6
C3M0065090D Rev. D, 06-2019
Typical Performance
600 Conditions:
TJ = 25 °C
500
VDD = 400 V IDS = 20 A
VGS = -4V/+15 V
FWD = C3M0065090D 400 L = 65.7 μH
300
ETotal EOn
Switching Loss (µJ)
200
EOff 100
0
0
5
10
15
20
25
External Gate Resistor RG(ext) (Ohms)
Switching Times (ns)
Figure 25. Clamped Inductive Switching Energy vs. RG(ext)
100 Conditions: TJ = 25 °C VDD = 400 V
80 IDS = 20 A VGS = -4V/+15 V FWD = C3M0065090D L = 65.7 μH
60 td(on)
40
20
0 0
td(off) tr tf
5
10
15
20
25
External Gate Resistor RG(ext) (Ohms)
35 30 25 20 15 10
5 0
0
Figure 27. Switching Times vs. RG(ext)
Conditons: VDD = 50 V
20
40
60
80
100
Time in Avalanche TAV (us)
Figure 29. Single Avalanche SOA curve
Avalanche Current (A)
Switching Loss (µJ)
600 Conditions:
IDS = 20 A
500
VDD = 400 V RG(ext) = 2.5 Ω
VGS = -4V/+15 V
FWD = C3M0065090D 400 L = 65.7 μH
ETotal EOn
300
200
100
0 0
EOff
25
50
75
100
125
150
175
Junction Temperature, TJ (°C)
Figure 26. Clamped Inductive Switching Energy vs. Temperature
Figure 28. Switching Times Definition
7
C3M0065090D Rev. D, 06-2019
Test Circuit Schematic
VDC
RG
VGS= - 4V
Q1
C3M0065090D
Q2 RG
C3M0065090D D.U.T
Figure 30. Clamped Inductive Switching Waveform Test Circuit
Note (3): Turn-off and Turn-on switching energy and timing values measured using SiC MOSFET Body Diode as shown above.
8
C3M0065090D Rev. D, 06-2019
Package Dimensions
Package TO-247-3
T
U
Pinout Information:
• Pin 1 = Gate
• Pin 2, 4 = Drain
V
W
• Pin 3 = Source
Recommended Solder Pad Layout
POS
A A1 A2 b b1 b2 b3 b4 c D D1 D2 E E1 E2 E3 E4 e N L L1 ØP Q S T U V W
Inches
Min
Max
.190
.205
.090
.100
.075
.085
.042
.052
.075
.095
.075
.085
.113
.133
.113
.123
.022
.027
.819
.831
.640
.695
.037
.049
.620
.635
.516
.557
.145
.201
.039
.075
.487
.529
.214 BSC
3
.780
.800
.161
.173
.138
.144
.216
.236
.238
.248
11˚
11˚
Millimeters
Min
Max
4.83
5.21
2.29
2.54
1.91
2.16
1.07
1.33
1.91
2.41
1.91
2.16
2.87
3.38
2.87
3.13
0.55
0.68
20.80
21.10
16.25
17.65
0.95
1.25
15.75
16.13
13.10
14.15
3.68
5.10
1.00
1.90
12.38
13.43
5.44 BSC
3
19.81
20.32
4.10
4.40
3.51
3.65
5.49
6.00
6.04
6.30
11˚
11˚
TO-247-3
9
C3M0065090D Rev. D, 06-2019
Notes
• RoHS Compliance The levels of RoHS restricted materials in this product are below the maximum concentration values (also referred to as the threshold limits) permitted for such substances, or are used in an exempted application, in accordance with EU Directive 2011/65/ EC (RoHS2), as implemented January 2, 2013. RoHS Declarations for this product can be obtained from your Cree representative or from the Product Documentation sections of www.cree.com.
• REACh Compliance REACh substances of high concern (SVHCs) information is available for this product. Since the European Chemical Agency (ECHA) has published notice of their intent to frequently revise the SVHC listing for the foreseeable future,please contact a Cree representative to insure you get the most up-to-date REACh SVHC Declaration. REACh banned substance information (REACh Article 67) is also available upon request.
• This product has not been designed or tested for use in, and is not intended for use in, applications implanted into the human body
nor in applications in which failure of the product could lead to death, personal injury or property damage, including but not limited to equipment used in the operation of nuclear facilities, life-support machines, cardiac defibrillators or similar emergency medical equipment, aircraft navigation or communication or control systems, air traffic control systems.
Related Links
• SPICE Models: http://wolfspeed.com/power/tools-and-support • SiC MOSFET Isolated Gate Driver reference design: http://wolfspeed.com/power/tools-and-support • SiC MOSFET Evaluation Board: http://wolfspeed.com/power/tools-and-support
Copyright © 2019 Cree, Inc. All rights reserved. The information in this document is subject to change without notice. Cree, the Cree logo, and Zero Recovery are registered trademarks of Cree, Inc.
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C3M0065090D Rev. D, 06-2019
Cree, Inc. 4600 Silicon Drive Durham, NC 27703 USA Tel: +1.919.313.5300 Fax: +1.919.313.5451 www.wolfspeed.com/power
Mouser Electronics
Authorized Distributor
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C3M0065090D